Jun-Rui Qin

Novel Layout Technique for Single-Event Transient Mitigation Using Dummy Transistor

Jianjun Chen, Shuming Chen, Yibai He et al. · IEEE Transactions on Device and Materials Reliability · 2012 · 62 citations

Engineering, Computer Engineering, Electrical Engineering +11

Novel Layout Technique for N-Hit Single-Event Transient Mitigation via Source-Extension

Jianjun Chen, Shuming Chen, Yibai He et al. · IEEE Transactions on Nuclear Science · 2012 · 52 citations

Engineering, Computer Engineering, Electrical Engineering +17

Calculating the Soft Error Vulnerabilities of Combinational Circuits by Re-Considering the Sensitive Area

Shuming Chen, Yankang Du, Biwei Liu et al. · IEEE Transactions on Nuclear Science · 2014 · 25 citations

Engineering, Computer Engineering, Electrical Engineering +13

3-D TCAD simulation study of the single event effect on 25 nm raised source-drain FinFET

Jun-Rui Qin, Shuming Chen, Jianjun Chen · Science China Technological Sciences · 2012 · 19 citations

Engineering, Computer Engineering, Electrical Engineering +16

Research on single event transient pulse quenching effect in 90 nm CMOS technology

Jun-Rui Qin, Shuming Chen, Biwei Liu et al. · Science in China. Series E, Technological sciences/Science in China. Series E, Technological Sciences · 2011 · 18 citations

Engineering, Computer Engineering, Electrical Engineering +12