C. Sanderson

An experimental study of single-event effects induced in commercial SRAMs by neutrons and protons from thermal energies to 500 MeV

C. S. Dyer, S. Clucas, C. Sanderson et al. · IEEE Transactions on Nuclear Science · 2004 · 65 citations

Electrical Engineering, Commercial Srams, Engineering +14

Investigation of single-ion multiple-bit upsets in memories on board a space experiment

S. Büchner, A.B. Campbell, T. Meehan et al. · IEEE Transactions on Nuclear Science · 2000 · 46 citations

Engineering, Space Environment, Radiation Effect +16

Comparison between SRAM SEE cross-sections from ion beam testing with those obtained using a new picosecond pulsed laser facility

R. Jones, Andrew Michael Chugg, C.M. Jones et al. · IEEE Transactions on Nuclear Science · 2000 · 42 citations

Engineering, Laser-plasma Interaction, Laser Applications +17

Microdosimetry code simulation of charge-deposition spectra, single-event upsets and multiple-bit upsets

C. S. Dyer, C. Comber, P.R. Truscott et al. · IEEE Transactions on Nuclear Science · 1999 · 29 citations

Engineering, Glow Discharge, Single-event Upsets +20

Radiation environment measurements from CREAM and CREDO during the approach to solar maximum

C. S. Dyer, P.R. Truscott, C. Sanderson et al. · IEEE Transactions on Nuclear Science · 2000 · 17 citations

Engineering, Space Environment, Cosmic Neutrino Background +17