P. Blaise

Understanding RRAM endurance, retention and window margin trade-off using experimental results and simulations

Cécile Nail, G. Molas, P. Blaise et al. · 2016 · 125 citations

Non-volatile Memory, Engineering, Computer Architecture +18

HfO<sub>2</sub>-Based RRAM: Electrode Effects, Ti/HfO<sub>2</sub> Interface, Charge Injection, and Oxygen (O) Defects Diffusion Through Experiment and <italic>Ab Initio</italic> Calculations

Boubacar Traoré, P. Blaise, Elisa Vianello et al. · IEEE Transactions on Electron Devices · 2015 · 93 citations

Engineering, Emerging Memory Technology, Charge Transport +16

On the Origin of Low-Resistance State Retention Failure in HfO₂-Based RRAM and Impact of Doping/Alloying

Boubacar Traoré, P. Blaise, Elisa Vianello et al. · IEEE Transactions on Electron Devices · 2015 · 84 citations

Materials Science, Materials Engineering, Electrical Engineering +13

Grain boundary composition and conduction in HfO2: An <i>ab initio</i> study

Kan‐Hao Xue, P. Blaise, L. R. C. Fonseca et al. · Applied Physics Letters · 2013 · 61 citations · Full text

Engineering, Solid-state Chemistry, Electronic Properties +18

A Combined &lt;italic&gt;Ab Initio&lt;/italic&gt; and Experimental Study on the Nature of Conductive Filaments in &lt;inline-formula&gt; &lt;tex-math notation="TeX"&gt;${\rm Pt}/{\rm Hf}{\rm O}_{2}/{\rm Pt}$ &lt;/tex-math&gt;&lt;/inline-formula&gt; Resistive Random Access Memory

Kan‐Hao Xue, Boubacar Traoré, P. Blaise et al. · IEEE Transactions on Electron Devices · 2014 · 59 citations

Materials Science, Engineering, Physics +13