A. Nozoe

A new data retention mechanism after endurance stress on flash memory

Hirokazu KAMEYAMA, Yutaka Okuyama, Shiro Kamohara et al. · 2002 · 40 citations

Non-volatile Memory, Engineering, Retention Lifetime +16

Detailed observation of small leak current in flash memories with thin tunnel oxides

Y. Manabe, Kikuo Okuyama, K. Kubota et al. · IEEE Transactions on Semiconductor Manufacturing · 1999 · 39 citations

Non-volatile Memory, Electrical Engineering, Engineering +12

A 256-Mb multilevel flash memory with 2-MB/s program rate for mass storage applications

A. Nozoe, H. Kotani, Tatsuhiro Tsujikawa et al. · IEEE Journal of Solid-State Circuits · 1999 · 34 citations

Hardware Security, Non-volatile Memory, Electrical Engineering +14

A 3.3 V high-density AND flash memory with 1 ms/512B erase and program time

A. Nozoe, Takayuki Yamazaki, Hiroshi Sato et al. · 2002 · 19 citations

V High-density And, Non-volatile Memory, Electrical Engineering +13

Dual-regulator dual-decoding-trimmer DRAM voltage limiter for burn-in test

Masashi Horiguchi, Masakazu Aoki, J. Etoh et al. · IEEE Journal of Solid-State Circuits · 1991 · 13 citations

Hardware Security, Electrical Engineering, Engineering +10