T. Heller

Design and performance of a reflectron based time-of-flight secondary ion mass spectrometer with electrodynamic primary ion mass separation

E. Niehuis, T. Heller, H. Feld et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1987 · 137 citations

Microscopy, Clinical Mass Spectrometry, Biological Mass Spectrometry +21

High mass resolution surface imaging with a time-of-flight secondary ion mass spectroscopy scanning microprobe

Johannes Schwieters, H.‐G. Cramer, T. Heller et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1991 · 107 citations

High Resolution, Engineering, Microscopy +26

Fast algorithm for the resolution of spectra

Richard A. Caruana, Roger B. Searle, T. Heller et al. · Analytical Chemistry · 1986 · 94 citations

Spectral Theory, Engineering, Media Standards +19

Electronic and chemical passivation of hexagonal 6H–SiC surfaces by hydrogen termination

N. Sieber, B.F. Mantel, Thomas Seyller et al. · Applied Physics Letters · 2001 · 92 citations · Full text

Engineering, High-temperature Hydrogen Treatment, Surface Band +16

High mass resolution time‐of‐flight secondary ion mass spectrometry. Application to peak assignments

E. Niehuis, P. N. T. Van Velzen, Johan Lub et al. · Surface and Interface Analysis · 1989 · 63 citations

Engineering, Chemical Composition, Ion Mobility Spectrometry +20