P. N. T. Van Velzen

High mass resolution time‐of‐flight secondary ion mass spectrometry. Application to peak assignments

E. Niehuis, P. N. T. Van Velzen, Johan Lub et al. · Surface and Interface Analysis · 1989 · 63 citations

Engineering, Chemical Composition, Ion Mobility Spectrometry +20

Isomerization of molecular ions of alkenes and cycloalkanes studied by photodissociation in an ICR spectrometer

P. N. T. Van Velzen, W.J. van der Hart · Chemical Physics · 1981 · 34 citations

Molecular Spectroscopy, Molecular Ions, Photochemistry +14

The structures of C2H4O+ ions

P. N. T. Van Velzen, W.J. van der Hart · Chemical Physics Letters · 1981 · 30 citations

Inorganic Chemistry, Structure Elucidation, Chemistry +2

Contamination of aluminium oxide surfaces in ambient air investigated by FTIR MSR and TOF SIMS. Chemisorption of aliphatic carboxylic acids

A.H.M. Sondag, M.C. Raas, P. N. T. Van Velzen · Chemical Physics Letters · 1989 · 29 citations

Chemical Engineering, Environmental Chemistry, Engineering +10

TOF‐SIMS analysis of the surface of insulators. Examples of chemically modified polymers and glass

Johan Lub, P. N. T. Van Velzen, D. van Leyen et al. · Surface and Interface Analysis · 1988 · 24 citations

Engineering, Chemistry, Ion Process +21