D. van Leyen

Molecular weight distributions of polymers using time-of-flight secondary-ion mass spectrometry

Ioannis V. Bletsos, David M. Hercules, D. van Leyen et al. · Analytical Chemistry · 1991 · 91 citations

Natural Sciences, Chemistry, Analytical Chemistry +14

Time-of-flight secondary ion mass spectrometry of polymer materials

D. van Leyen, Birgit Hagenhoff, E. Niehuis et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1989 · 80 citations

Natural Sciences, Chemistry, Materials Science +17

Time-of-flight secondary ion mass spectrometry of insulators with pulsed charge compensation by low-energy electrons

Birgit Hagenhoff, D. van Leyen, E. Niehuis et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1989 · 54 citations

Natural Sciences, Materials Science, Physics +14

The time of flight static secondary negative ion mass spectra of poly(methylmethacrylate), poly(ethylmethacrylate), and poly(methylmethacrylate‐co‐ethylmethacrylate). Ion structures and quantification

Johan Lub, F. C. B. M. van Vroonhoven, D. van Leyen et al. · Journal of Polymer Science Part B Polymer Physics · 1989 · 37 citations

Natural Sciences, Chemistry, Materials Science +15

TOF‐SIMS analysis of the surface of insulators. Examples of chemically modified polymers and glass

Johan Lub, P. N. T. Van Velzen, D. van Leyen et al. · Surface and Interface Analysis · 1988 · 24 citations

Natural Sciences, Chemistry, Materials Science +13