Xavier Lafontan

The advent of MEMS in space

Xavier Lafontan, F. Pressecq, F. Beaudoin et al. · Microelectronics Reliability · 2003 · 32 citations

Engineering, Aerospace Engineering, Physics +10

A new method for the hermeticity testing of wafer-level packaging

Djemel Lellouchi, Jérémie Dhennin, Xavier Lafontan et al. · Journal of Micromechanics and Microengineering · 2010 · 24 citations

Engineering, Materials Science, Materials Characterization +16

Validation of bending tests by nanoindentation for micro-contact analysis of MEMS switches

Adrien Broué, Thibaut Fourcade, Jérémie Dhennin et al. · Journal of Micromechanics and Microengineering · 2010 · 22 citations

Engineering, Electrical Engineering, Materials Science +17

<title>Environmental test bench for reliability studies: influence of the temperature on rf switches with metallic membranes</title>

Xavier Lafontan, Christophe Le Touze, B. Wenk et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2002 · 17 citations

Engineering, Electrical Engineering, Materials Science +17

Experimental setup and realization of thin film specimens for microtensile tests

C. Malhaire, Cédric Seguineau, Michel Ignat et al. · Review of Scientific Instruments · 2009 · 17 citations

Natural Sciences, Materials Engineering, Materials Science +17