Alexandre Le Roch

Simulation of Single-Particle Displacement Damage in Silicon—Part III: First Principle Characterization of Defect Properties

Antoine Jay, Anne Hémeryck, N. Richard et al. · IEEE Transactions on Nuclear Science · 2018 · 28 citations · Full text

Engineering, Mechanical Engineering, Computational Chemistry +21

Radiation-Induced Leakage Current and Electric Field Enhancement in CMOS Image Sensor Sense Node Floating Diffusions

Alexandre Le Roch, Cédric Virmontois, Philippe Paillet et al. · IEEE Transactions on Nuclear Science · 2019 · 27 citations · Full text

Engineering, Nuclear Physics, Radiation Materials Science +22

Radiation-Induced Defects in 8T-CMOS Global Shutter Image Sensor for Space Applications

Alexandre Le Roch, Cédric Virmontois, Vincent Goiffon et al. · IEEE Transactions on Nuclear Science · 2018 · 25 citations

Displacement Damage Defects, Defect Tolerance, Defects Creation +13

Radiation-Induced Variable Retention Time in Dynamic Random Access Memories

Vincent Goiffon, Antoine Jay, Philippe Paillet et al. · IEEE Transactions on Nuclear Science · 2019 · 25 citations

Non-volatile Memory, Engineering, Variable Retention Time +20

Dark Current Limiting Mechanisms in CMOS Image Sensors

Dan McGrath, Steve Tobin, Vincent Goiffon et al. · Electronic Imaging · 2018 · 21 citations

Electrical Engineering, Photoelectric Sensor, Engineering +12