Jiro Matsuo

Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams

Satoshi Ninomiya, Kazuya Ichiki, Hideaki Yamada et al. · Rapid Communications in Mass Spectrometry · 2009 · 211 citations

Engineering, Microscopy, Ion Mobility Spectrometry +18

Organic Depth Profiling of a Nanostructured Delta Layer Reference Material Using Large Argon Cluster Ions

J. L. S. Lee, Satoshi Ninomiya, Jiro Matsuo et al. · Analytical Chemistry · 2009 · 166 citations

Engineering, Organic Surfaces, Ar Cluster Ions +22

Measurements of secondary ions emitted from organic compounds bombarded with large gas cluster ions

Satoshi Ninomiya, Yoshihiko Nakata, Kazuya Ichiki et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2006 · 160 citations

Secondary Ions, Engineering, Physics +12

Molecular depth profiling of multilayer structures of organic semiconductor materials by secondary ion mass spectrometry with large argon cluster ion beams

Satoshi Ninomiya, Kazuya Ichiki, Hideaki Yamada et al. · Rapid Communications in Mass Spectrometry · 2009 · 103 citations

Organic Multilayer Samples, Engineering, Organic Electronics +16

Incident angle dependence of the sputtering effect of Ar-cluster-ion bombardment

Hiroaki Kitani, Noriaki Toyoda, Jiro Matsuo et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1997 · 89 citations

Ion Implantation, Engineering, Physics +5