Yoshihiko Nakata

Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams

Satoshi Ninomiya, Kazuya Ichiki, Hideaki Yamada et al. · Rapid Communications in Mass Spectrometry · 2009 · 211 citations

Engineering, Microscopy, Ion Mobility Spectrometry +18

Measurements of secondary ions emitted from organic compounds bombarded with large gas cluster ions

Satoshi Ninomiya, Yoshihiko Nakata, Kazuya Ichiki et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2006 · 160 citations

Secondary Ions, Engineering, Physics +12

Molecular depth profiling of multilayer structures of organic semiconductor materials by secondary ion mass spectrometry with large argon cluster ion beams

Satoshi Ninomiya, Kazuya Ichiki, Hideaki Yamada et al. · Rapid Communications in Mass Spectrometry · 2009 · 103 citations

Organic Multilayer Samples, Engineering, Organic Electronics +16

A fragment-free ionization technique for organic mass spectrometry with large Ar cluster ions

Satoshi Ninomiya, Yoshihiko Nakata, Yoshiro Honda et al. · Applied Surface Science · 2008 · 62 citations

Fragment-free Ionization Technique, Analytical Instrumentation, Biochemistry +13

High sputtering yields of organic compounds by large gas cluster ions

Kazuya Ichiki, Satoshi Ninomiya, Yoshihiko Nakata et al. · Applied Surface Science · 2008 · 54 citations

Materials Science, Cluster Science, Engineering +6