Rolf Lauer

Absolute Measurement of the (220) Lattice Plane Spacing in a Silicon Crystal

Peter Becker, K. Dorenwendt, G. Ebeling et al. · Physical Review Letters · 1981 · 221 citations

Natural Sciences, Materials Science, Physics +13

Sizes and distances of metal clusters in Au-, Pt-, W- and Fe-containing diamond-like carbon hard coatings: a comparative study by small angle X-ray scattering, wide angle X-ray diffraction, transmission electron microscopy and scanning tunnelling microscopy

K. Schiffmann, M. Fryda, G. Goerigk et al. · Thin Solid Films · 1999 · 114 citations

Natural Sciences, Materials Engineering, Materials Science +17

Interfacial roughness and related growth mechanisms in sputtered W/Si multilayers

Tim Salditt, D. Lott, T. H. Metzger et al. · Physical review. B, Condensed matter · 1996 · 83 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17

Characterization of the dynamics of semiconductor lasers using optical modulation

C. B. Su, J. Eom, C. Lange et al. · IEEE Journal of Quantum Electronics · 1992 · 59 citations

Engineering, Electrical Engineering, Optics +16

Statistical methods for the correction of tip convolution effects in STM imaging of nanometer size particles in metal—C: H films

K. Schiffmann, M. Fryda, Rolf Lauer et al. · Ultramicroscopy · 1996 · 18 citations

Natural Sciences, Chemistry, Materials Science +17