T. H. Metzger - Concepedia

Author

T. H. Metzger

Also Known As

Metzger, T. H., Metzger, T.H., T H Metzger, T. H Metzger, T. H. Metzger, T.-H. Metzger, T.H Metzger, T.H. Metzger, Th . Metzger, Th. Metzger

Publications

1.9K

Citations

H-Index

Concepts

All Affiliations

Ludwig-Maximilians-Universität München Johannes Kepler University of Linz Technical University of Munich European Synchrotron Radiation Facility Schott (Germany)

About

T. H. Metzger is an author at Ludwig-Maximilians-Universität München specializing in materials science, applied physics, and engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	20	34	1.4K
2	Applied Physics	20	34	1.4K
3	Natural Sciences	5	5	203
4	Chemistry	3	3	50
5	Electrical Engineering	1	1	150

T. H. Metzger

Publications

1.8K

Citations

H-Index

Page 1

	Year	Citations
Nanometer-Scale Resolution of Strain and Interdiffusion in Self-Assembled<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>InAs</mml:mi><mml:mi>/</mml:mi><mml:mi>GaAs</mml:mi></mml:math>Quantum Dots I. Kegel, T. H. Metzger, A. Lorke, Physical Review Letters EngineeringMicroscopyNanometer-scale ResolutionReciprocal SpaceSemiconductor Nanostructures	2000	205
Parametric amplification of few-cycle carrier-envelope phase-stable pulses at 21 μm Takao Fuji, Nobuhisa Ishii, Catherine Y. Teisset, Optics Letters	2006	183
Determination of strain fields and composition of self-organized quantum dots using x-ray diffraction I. Kegel, T. H. Metzger, A. Lorke, Physical review. B, Condensed matter Self-organized Quantum DotsEngineeringColloidal NanocrystalsSemiconductor NanostructuresQuantum Dots	2001	152
Piezoelectric Al1−xScxN thin films: A semiconductor compatible solution for mechanical energy harvesting and sensors Ramin Matloub, Mahmoud Hadad, Andrea Mazzalai, Applied Physics Letters EngineeringMechanical Energy HarvestingFlexible SensorPiezoelectric MaterialAl1-xscxn Thin Films	2013	150
Determination of the Height-Height Correlation Function of Rough Surfaces from Diffuse X-Ray Scattering Tim Salditt, T. H. Metzger, J. Peisl, Europhysics Letters (EPL)	1995	100
Determination of the static scaling exponent of self-affine interfaces by nonspecular x-ray scattering Tim Salditt, T. H. Metzger, Ch. Brandt, Physical review. B, Condensed matter X-ray SpectroscopyEngineeringMicroscopySelf-affine SurfaceElectron Diffraction	1995	83
Interfacial roughness and related growth mechanisms in sputtered W/Si multilayers Tim Salditt, D. Lott, T. H. Metzger, Physical review. B, Condensed matter EngineeringX-ray ReflectivityElectron DiffractionSilicon On InsulatorWafer Scale Processing	1996	83
Solid state NMR study supporting the lithium vacancy defect model in congruent lithium niobate Janet Blümel, E. Born, T. H. Metzger Journal of Physics and Chemistry of Solids Materials ScienceEngineeringLi-ion Battery MaterialsLithium-ion BatteryCondensed Matter Physics	1994	77
Strain and composition distribution in uncapped SiGe islands from x-ray diffraction J. Stangl, A. Daniel, V. Holý, Applied Physics Letters Materials ScienceMaterials EngineeringEngineeringPhysicsStrain Localization	2001	61
Non-specular X-ray scattering from thin films and multilayers with small-angle scattering equipment Tim Salditt, T. H. Metzger, J. Peisl, Journal of Physics D Applied Physics X-ray SpectroscopyEngineeringRough InterfacesX-ray FluorescenceX-ray Imaging	1995	49

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