T. Ehmann

Determination of ultra trace contaminants on silicon wafer surfaces using total-reflection X-ray fluorescence TXRF ‘state-of-the-art’

S. Pahlke, L. Fabry, L. Kotz et al. · Spectrochimica Acta Part B Atomic Spectroscopy · 2001 · 67 citations

Surface Characterization, Chemical Engineering, Engineering +8

Optimization of the electrokinetic sample introduction in capillary electrophoresis for the ultra trace determination of anions on silicon wafer surfaces

T. Ehmann, K. Bächmann, L. Fabry et al. · Chromatographia · 1997 · 31 citations

Chemical Engineering, Engineering, Capillary Electrophoresis +13

Analysis of organic contaminants on Si wafers with TXRF-NEXAFS

G. Pepponi, Burkhard Beckhoff, T. Ehmann et al. · Spectrochimica Acta Part B Atomic Spectroscopy · 2003 · 26 citations

Chemical Engineering, Engineering, Si Wafers +2

Analysis of low Z elements on Si wafer surfaces with undulator radiation induced total reflection X-ray fluorescence at the PTB beamline at BESSY II

Christina Streli, G. Pepponi, P. Wobrauschek et al. · Spectrochimica Acta Part B Atomic Spectroscopy · 2003 · 19 citations

Ii-vi Semiconductor, X-ray Spectroscopy, Engineering +11

Influencing of the migration time in CZE

J. Boden, T. Ehmann, T. Groh et al. · Analytical and Bioanalytical Chemistry · 1994 · 16 citations

Human Migration, International Population Movement, Migration Time +2