Laura M. Giovane

Correlation between leakage current density and threading dislocation density in SiGe <i>p-i-n</i> diodes grown on relaxed graded buffer layers

Laura M. Giovane, Hsin-Chiao Luan, Anu Agarwal et al. · Applied Physics Letters · 2001 · 173 citations

Semiconductor Technology, Leakage Current Density, Electrical Engineering +13

Isolation of fullerene products from flames: Structure and synthesis of the C60-cyclopentadiene adduct

Vincent M. Rotello, Jack B. Howard, Tapesh Yadav et al. · Tetrahedron Letters · 1993 · 116 citations

Chemical Engineering, Engineering, Fullerene +5

Kinetic stability of the fullerene C60-cyclopentadiene Diels-Alder adduct

Laura M. Giovane, Joseph W. Barco, Tapesh Yadav et al. · The Journal of Physical Chemistry · 1993 · 83 citations

Chemical Engineering, Molecular Sciences, Engineering +15

Influence of strain on semiconductor thin film epitaxy

Eugene A. Fitzgerald, Srikanth Samavedam, Y. H. Xie et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1997 · 77 citations

Materials Science, Dislocation Densities, Engineering +14

Development and Characterization of 100 Gb/s Data Communication VCSELs

M. V. R. K. Murty, Jingyi Wang, Ann Lehman Harren et al. · IEEE Photonics Technology Letters · 2021 · 39 citations

Photonics, Engineering, Vlsi Design +15