S. Schippel

Spectrally resolved cavity ring down measurement of high reflectivity mirrors using a supercontinuum laser source

Gabriele Schmidl, W. Paa, W. Triebel et al. · Applied Optics · 2009 · 19 citations

Photonic Sensor, Engineering, Laser Science +16

Ion beam induced epitaxial regrowth and layer by layer amorphization of compound semiconductors during MeV ion implantation

E. Glaser, T. Bachmann, Robert Schulz et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1995 · 16 citations

Semiconductors, Materials Science, Ion Implantation +6

Compositional investigation of sputtered amorphous SiOX:H

F. Stolze, Margit Zacharias, S. Schippel et al. · Solid State Communications · 1993 · 15 citations

Materials Engineering, Materials Science, Engineering +6

Deposition of rutile TiO2 films by pulsed and high power pulsed magnetron sputtering

Waldemar Schönberger, Hagen Bartzsch, S. Schippel et al. · Surface and Coatings Technology · 2015 · 14 citations

Materials Engineering, Materials Science, Engineering +10

Comparison of MeV-implanted GaAs and InP

T. Bachmann, S. Schippel, E. Wendler et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1994 · 13 citations

Ion Implantation, Electrical Engineering, Engineering +4