Concepedia

R. J. Gleixner

RJ

Statistics

Publications

6

Citations

315

H-Index

6

Active since

1992

Affiliations

Stanford University(Current)

R. J. Gleixner is an author at Stanford University specializing in electronic materials, materials science, and void nucleation.

Publications per year

1992–1999

6

Publications

6

Void Nucleation in Passivated Interconnect Lines: Effects of Site Geometries, Interfaces, and Interface Flaws

R. J. Gleixner, B Clemens, William D. Nix · Journal of materials research/Pratt's guide to venture capital sources · 1997 · 112 citations

, , +15

A physically based model of electromigration and stress-induced void formation in microelectronic interconnects

R. J. Gleixner, William D. Nix · Journal of Applied Physics · 1999 · 67 citations

, , +17

Thermal-stress-induced voiding in narrow, passivated Cu lines

P. Bo rgesen, J. K. Lee, R. J. Gleixner et al. · Applied Physics Letters · 1992 · 66 citations

, , +17

Void Nucleation on a Contaminated Patch

B Clemens, William D. Nix, R. J. Gleixner · Journal of materials research/Pratt's guide to venture capital sources · 1997 · 44 citations

, , +9

An Analysis of Void Nucleation In Passivated Interconnect Lines Due to Vacancy Condensation and Interface Contamination

R. J. Gleixner, W.D. Nix · MRS Proceedings · 1996 · 13 citations

, , +17

1–5 of 6