Concepedia

C. Messick

CM

Statistics

Publications

8

Citations

236

H-Index

8

Active since

1994

Affiliations

National Institute of Standards and Technology(Current)

University of Maryland, College Park

Texas Instruments (United States)

Motorola (United States)

Fairchild Semiconductor (United States)

C. Messick is an author at National Institute of Standards and Technology specializing in engineering, electrical engineering, and microelectronics.

Top concepts

EngineeringMicroelectronicsElectrical InsulationElectrical EngineeringApplied PhysicsMaterial SciencePhysicsElectronic PackagingThin FilmsDielectrics

Publications per year

1994–1998

8

Publications

8

Field and temperature acceleration of time-dependent dielectric breakdown in intrinsic thin SiO/sub 2/

John S. Suehle, P. Chaparala, C. Messick et al. · 1994 · 99 citations

Engineering, Thin Film Process Technology, Silicon On Insulator +16

Electric field dependent dielectric breakdown of intrinsic SiO/sub 2/ films under dynamic stress

P. Chaparala, John S. Suehle, C. Messick et al. · 1996 · 35 citations

Engineering, Silicon On Insulator, Stress Electric Field +17

A new physics-based model for time-dependent Dielectric breakdown

B. Schlund, John S. Suehle, C. Messick et al. · Microelectronics Reliability · 1996 · 29 citations

Electrical Engineering, Dielectrics, Engineering +5

A new physics-based model for time-dependent-dielectric-breakdown

B. Schlund, C. Messick, J.S. Suehle et al. · 1996 · 23 citations

Dielectrics, Engineering, New Physics-based Model +17

A new technique for determining long-term TDDB acceleration parameters of thin gate oxides

Chen Yuan, J.S. Suehle, Chih-Chieh Shen et al. · IEEE Electron Device Letters · 1998 · 14 citations

Thin Gate Oxides, Electrical Engineering, New Technique +13

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