C. Charpin-Nicolle

Tailoring the Switching Dynamics in Yttrium Oxide‐Based RRAM Devices by Oxygen Engineering: From Digital to Multi‐Level Quantization toward Analog Switching

Stefan Petzold, Eszter Piros, Robert Eilhardt et al. · Advanced Electronic Materials · 2020 · 36 citations · Full text

Engineering, Materials Engineering, Materials Science +16

16kbit 1T1R OxRAM arrays embedded in 28nm FDSOI technology demonstrating low BER, high endurance, and compatibility with core logic transistors

L. Grenouillet, N. Castellani, A. Persico et al. · 2021 · 31 citations

Engineering, Computer Engineering, Electrical Engineering +12

Defect-Induced Phase Transition in Hafnium Oxide Thin Films: Comparing Heavy Ion Irradiation and Oxygen-Engineering Effects

Tobias Vogel, Nico Kaiser, Stefan Petzold et al. · IEEE Transactions on Nuclear Science · 2021 · 22 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17

Study of Nanosecond Laser Annealing on Silicon Doped Hafnium Oxide Film Crystallization and Capacitor Reliability

Tarek Ali, Ricardo Olivo, S. Kerdilès et al. · 2022 · 22 citations

Natural Sciences, Materials Engineering, Materials Science +16

Structural and Electrical Response of Emerging Memories Exposed to Heavy Ion Radiation

Tobias Vogel, Alexander Zintler, Nico Kaiser et al. · ACS Nano · 2022 · 17 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17