V. Lauer

Electrical and optical characterisation of vanadium in 4H and 6H–SiC

V. Lauer, G. Brémond, A. Souifi et al. · Materials Science and Engineering B · 1999 · 41 citations

Materials Science, Electrical Engineering, Optical Materials +6

Application of Software Watchdog as a Dependability Software Service for Automotive Safety Relevant Systems

Xi Chen, Juejing Feng, Martin Hiller et al. · 2007 · 17 citations

Software Maintenance, Engineering, Safety Science +21

High Temperature Performance of Implanted-Gate n-Channel JFETs in 6H-SiC

S.T. Sheppard, V. Lauer, W. Wondrak et al. · Materials science forum · 1998 · 16 citations

Electrical Engineering, Engineering, Bias Temperature Instability +4

Deep level defects in H+ implanted 6H–SiC epilayers and in silicon carbide on insulator structures

E. Hugonnard-Bruyère, V. Lauer, G. Guillot et al. · Materials Science and Engineering B · 1999 · 14 citations

Materials Engineering, Materials Science, Semiconductor Technology +7

Spectroscopic Investigation of Vanadium Acceptor Level in 4H and 6H-SiC

V. Lauer, G. Brémond, A. Souifi et al. · Materials science forum · 2000 · 11 citations

Materials Science, Engineering, Spectroscopy +4