Concepedia

E.F. Da Silva

ED

Statistics

Publications

2

Citations

149

H-Index

2

Active since

1987

Affiliations

Hitachi (Japan)(Current)

Yale University

E.F. Da Silva is an author at Hitachi (Japan) specializing in hot-carrier degradation, electronic materials, and traps.

Publications per year

1987–1988

2

Publications

2

Dramatic improvement of hot-electron-induced interface degradation in MOS structures containing F or Cl in SiO/sub 2/

Yasushiro Nishioka, E.F. Da Silva, Yanzhuang Wang et al. · IEEE Electron Device Letters · 1988 · 120 citations

, , +17

Time-dependent evolution of interface traps in hot-electron damaged metal/SiO<sub>2</sub>/Si capacitors

Yasushiro Nishioka, E.F. Da Silva, Tso‐Ping Ma · IEEE Electron Device Letters · 1987 · 29 citations

, , +17

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