C. T. Hovland

Scanning ESCA: A new dimension for electron spectroscopy

C. T. Hovland · Applied Physics Letters · 1977 · 41 citations

Natural Sciences, Physics, Optics +12

Edge effect in high-resolution scanning Auger-electron microscopy

Ryuichi Shimizu, T. E. Everhart, Nick MacDonald et al. · Applied Physics Letters · 1978 · 33 citations

Natural Sciences, Materials Science, Physics +17

Scanning Auger microprobe study of gold–nickel–copper diffusion in thin films

Thomas Brady, C. T. Hovland · Journal of Vacuum Science and Technology · 1981 · 17 citations

Natural Sciences, Materials Engineering, Materials Science +14

Scanning electron-stimulated desorption microscopy of model-biological surfaces

H.F. Dylla, J. H. Abrams, C. T. Hovland et al. · Nature · 1981 · 17 citations

Natural Sciences, Bioengineering, Biomedical Engineering +13

The Material Properties of Silicon Nitride Formed by Low Energy Ion Implantation

T.-Y. Chiu, W.G. Oldham, C. T. Hovland · Journal of The Electrochemical Society · 1984 · 12 citations · Full text

Engineering, Materials Engineering, Materials Science +17