H. Holzbrecher

Differences in growth mechanisms of oxide scales formed on ODS and conventional wrought alloys

W. J. Quadakkers, H. Holzbrecher, K. G. Briefs et al. · Oxidation of Metals · 1989 · 257 citations

Materials Science, Materials Engineering, Engineering +9

Electroluminescence of erbium–oxygen-doped silicon diodes grown by molecular beam epitaxy

J. Stimmer, A. Reittinger, J. F. Nützel et al. · Applied Physics Letters · 1996 · 148 citations

Semiconductors, Photonics, Electrical Engineering +15

Erbium incorporation in LiNbO 3 by diffusion-doping

Ingo Baumann, Ralf Brinkmann, M. Dinand et al. · Applied Physics A · 1996 · 128 citations

Materials Science, Engineering, Applied Physics +3

Quantitative analysis of oxide films on ODS-alloys using MCs+-SIMS and e-beam SNMS

J.-P. Pfeifer, H. Holzbrecher, W. J. Quadakkers et al. · Analytical and Bioanalytical Chemistry · 1993 · 44 citations

Materials Engineering, Materials Science, Material Analysis +9

Determination of lattice and grain boundary diffusion coefficients in protective alumina scales on high temperature alloys using SEM, TEM and SIMS

D. Clemens, K. Bongartz, W. J. Quadakkers et al. · Analytical and Bioanalytical Chemistry · 1995 · 30 citations

Materials Engineering, Materials Science, Engineering +11