Quantitative analysis of oxide films on ODS-alloys using MCs+-SIMS and e-beam SNMS - Concepedia

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Quantitative analysis of oxide films on ODS-alloys using MCs+-SIMS and e-beam SNMS

44

Citations

10

References

1993

Year

J.-P. Pfeifer, H. Holzbrecher, W. J. Quadakkers, U. Breuer, W. Speier

Analytical and Bioanalytical Chemistry

Materials EngineeringMaterials ScienceMaterial AnalysisEngineeringOxide ElectronicsSurface ScienceApplied PhysicsQuantitative AnalysisMolecular Beam EpitaxyOxide FilmsE-beam SnmsThin Film Processing

References

	Year	Citations

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