Vladimir V. Zavyalov

Suomi NPP CrIS measurements, sensor data record algorithm, calibration and validation activities, and record data quality

Yong Han, Henry E. Revercomb, Mike Cromp et al. · Journal of Geophysical Research Atmospheres · 2013 · 289 citations · Full text

Natural Sciences, Earth Sciences, Atmospheric Science +16

Noise performance of the CrIS instrument

Vladimir V. Zavyalov, Mark P. Esplin, Benjamin Esplin et al. · Journal of Geophysical Research Atmospheres · 2013 · 97 citations · Full text

Natural Sciences, Earth Sciences, Oceanography +17

Advances in experimental technique for quantitative two-dimensional dopant profiling by scanning capacitance microscopy

Vladimir V. Zavyalov, J. S. McMurray, C. C. Williams · Review of Scientific Instruments · 1999 · 89 citations

Engineering, Materials Engineering, Materials Science +17

Scanning capacitance microscope methodology for quantitative analysis of p-n junctions

Vladimir V. Zavyalov, J. S. McMurray, C. C. Williams · Journal of Applied Physics · 1999 · 82 citations

Engineering, Materials Engineering, Materials Science +17

Two dimensional dopant and carrier profiles obtained by scanning capacitance microscopy on an actively biased cross-sectioned metal–oxide–semiconductor field-effect transistor

Vladimir V. Zavyalov, J. S. McMurray, Spencer D. Stirling et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2000 · 33 citations

Engineering, Electrical Engineering, Materials Science +17