Ron Paulsen

Reliability of pFET EEPROM With 70-Å Tunnel Oxide Manufactured in Generic Logic CMOS Processes

Yanjun Ma, Troy Gilliland, Biao Wang et al. · IEEE Transactions on Device and Materials Reliability · 2004 · 37 citations

Engineering, Computer Engineering, Electrical Engineering +17

Highly Reliable 90-nm Logic Multitime Programmable NVM Cells Using Novel Work-Function-Engineered Tunneling Devices

Bin Wang, Hoc Nguyen, Yanjun Ma et al. · IEEE Transactions on Electron Devices · 2007 · 31 citations

Engineering, Computer Engineering, Electrical Engineering +14

Effect of layout orientation on the performance and reliabiltiy of high voltage N-LDMOS in standard submicron logic STI CMOS process

Bin Wang, Hoc Nguyen, J. Mavoori et al. · 2005 · 16 citations

Engineering, Electrical Engineering, Microelectronics +16

Measurement of ultralow gate tunneling currents using floating-gate integrator technique

Bin Wang, Yanjun Ma, Ron Paulsen et al. · IEEE Electron Device Letters · 2005 · 11 citations

Engineering, Electrical Engineering, Microelectronics +13

Floating-Gate Nonvolatile Memory With Ultrathin 5-nm Tunnel Oxide

Yanjun Ma, Rui Deng, Hoc Nguyen et al. · IEEE Transactions on Electron Devices · 2008 · 11 citations

Engineering, Computer Engineering, Electrical Engineering +15