T. Ishikawa

Relationship between threading dislocation and leakage current in 4H-SiC diodes

Hirokazu Fujiwara, Hideki Naruoka, Masaki Konishi et al. · Applied Physics Letters · 2012 · 101 citations

Engineering, Electrical Engineering, Materials Science +17

Impact of surface morphology above threading dislocations on leakage current in 4H-SiC diodes

Hirokazu Fujiwara, Hideki Naruoka, Masaki Konishi et al. · Applied Physics Letters · 2012 · 65 citations

Engineering, Electrical Engineering, Materials Science +17

Applications of DC Breakers and Concepts for Superconducting Fault-Current Limiter for a DC Distribution Network

Yukinaga Morishita, T. Ishikawa, Iwao Yamaguchi et al. · IEEE Transactions on Applied Superconductivity · 2009 · 51 citations

Engineering, Electrical Engineering, Circuit Theory +14

High-capacitance Cu/Ta/sub 2/O/sub 5//Cu MIM structure for SoC applications featuring a single-mask add-on process

T. Ishikawa, Daisuke Kodama, Y. Matsui et al. · 2003 · 45 citations

Engineering, Electrical Engineering, Materials Science +9

Ka-band ultra low noise MMIC amplifier using pseudomorphic HEMTs

S. Fujimoto, Takayuki Katoh, Takao Ishida et al. · 2002 · 36 citations

Engineering, Electrical Engineering, Microelectronics +16