Kouji Kondou

Depth resolution improvement in secondary ion mass spectrometry analysis using metal cluster complex ion bombardment

M. Tomita, T. Kinno, M. Koike et al. · Applied Physics Letters · 2006 · 31 citations

Engineering, Nuclear Physics, Ion Beam Instrumentation +17

Ion-beam characteristics of the metal cluster complex of Ir4(CO)12

Yukio Fujiwara, Kouji Kondou, Yoshikazu Teranishi et al. · Journal of Applied Physics · 2006 · 24 citations

Engineering, Ion Beam Instrumentation, Chemistry +16

Production of Stable Ion Beam of Os₃(CO)₁₂ with Compact Metal-Cluster-Complex Ion Source

Yukio Fujiwara, Kouji Kondou, Yoshikazu Teranishi et al. · Japanese Journal of Applied Physics · 2006 · 19 citations

Engineering, Metal-cluster-complex Ion Beams, Ion Beam Instrumentation +18

Secondary Ion Mass Spectrometry of Organic Thin Films Using Metal-Cluster-Complex Ion Source

Yukio Fujiwara, Kouji Kondou, Hidehiko Nonaka et al. · Japanese Journal of Applied Physics · 2006 · 18 citations

Engineering, Biological Mass Spectrometry, Organic Chemistry +16

SIMS depth profile study using metal cluster complex ion bombardment

M. Tomita, T. Kinno, M. Koike et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2006 · 15 citations

Ion Implantation, Engineering, Physics +5