J. B. Russell

Deep-Level Traps in CCD Image Sensors

W. C. McColgin, James P. Lavine, Charles V. Stancampiano et al. · MRS Proceedings · 1998 · 22 citations

Engineering, Computer Systems, Digital Imaging +10

Unintentional Doping of Wafers Due to Organophosphates in the Clean Room Ambient

John A. Lebens, W. C. McColgin, J. B. Russell et al. · Journal of The Electrochemical Society · 1996 · 20 citations

Engineering, Materials Engineering, Materials Science +16

The measurement of boron at silicon wafer surfaces by neutron depth profiling

R. G. Downing, James P. Lavine, T.Z. Hossain et al. · Journal of Applied Physics · 1990 · 10 citations · Full text

Natural Sciences, Materials Science, Nuclear Physics +11