Johannes Reinker

Conduction mechanisms in thin atomic layer deposited Al2O3 layers

Holger Spahr, Sebastian Montzka, Johannes Reinker et al. · Journal of Applied Physics · 2013 · 42 citations

Materials Science, Aluminium Nitride, Electrical Engineering +13

Charge carrier densities in chemically doped organic semiconductors verified by two independent techniques

Marcus Lehnhardt, Sami Hamwi, M. Hoping et al. · Applied Physics Letters · 2010 · 41 citations

Optical Materials, Engineering, Organic Electronics +20

Enhancement of the maximum energy density in atomic layer deposited oxide based thin film capacitors

Holger Spahr, Christine Nowak, Felix Hirschberg et al. · Applied Physics Letters · 2013 · 22 citations

Engineering, Hybrid Capacitor, Atomic Layer +17

Regimes of leakage current in ALD-processed Al₂O₃thin-film layers

Holger Spahr, Johannes Reinker, Tim Bülow et al. · Journal of Physics D Applied Physics · 2013 · 16 citations

Materials Science, Energy Band Gap, Electrical Engineering +14

Impact of morphological defects on the electrical breakdown of ultra thin atomic layer deposition processed Al2O3 layers

Holger Spahr, Tim Bülow, Christine Nowak et al. · Thin Solid Films · 2013 · 14 citations

Materials Science, Al2o3 Layers, Electrical Engineering +11