K. Shubhakar

Statistics

Publications

Citations

512

H-Index

Active since

2010

Affiliations

Singapore University of Technology and Design(Current)

Agency for Science, Technology and Research

Institute of Materials Research and Engineering

Nanyang Technological University

University of Modena and Reggio Emilia

K. Shubhakar is an author at Singapore University of Technology and Design specializing in electronic materials, materials science, and natural sciences.

Publications per year

2010–2022

Publications

Conductive Atomic Force Microscope Study of Bipolar and Threshold Resistive Switching in 2D Hexagonal Boron Nitride Films

Alok Ranjan, Nagarajan Raghavan, S. J. O’Shea et al. · Scientific Reports · 2018 · 72 citations · Full text

Natural Sciences, Materials Science, Physics +17

Study of preferential localized degradation and breakdown of HfO2/SiOx dielectric stacks at grain boundary sites of polycrystalline HfO2 dielectrics

K. Shubhakar, K. L. Pey, Nagarajan Raghavan et al. · Microelectronic Engineering · 2013 · 53 citations

Natural Sciences, Materials Engineering, Materials Science +14

High-κ dielectric breakdown in nanoscale logic devices – Scientific insight and technology impact

Nagarajan Raghavan, K. L. Pey, K. Shubhakar · Microelectronics Reliability · 2014 · 46 citations

Engineering, Materials Engineering, Materials Science +17

Grain boundary assisted degradation and breakdown study in cerium oxide gate dielectric using scanning tunneling microscopy

K. Shubhakar, K. L. Pey, Sunil Singh Kushvaha et al. · Applied Physics Letters · 2011 · 34 citations

Engineering, Materials Engineering, Materials Science +17

Modified Percolation Model for Polycrystalline High-$ \kappa$ Gate Stack With Grain Boundary Defects

Nagarajan Raghavan, K. L. Pey, K. Shubhakar et al. · IEEE Electron Device Letters · 2010 · 32 citations

Engineering, Electrical Engineering, Materials Science +17

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