A. Cornfeld

Development of a parametric optical constant model for Hg1−xCdxTe for control of composition by spectroscopic ellipsometry during MBE growth

Blaine Johs, Craig M. Herzinger, J. H. Dinan et al. · Thin Solid Films · 1998 · 256 citations

Ii-vi Semiconductor, Optical Materials, Engineering +11

Experimental Results From Performance Improvement and Radiation Hardening of Inverted Metamorphic Multijunction Solar Cells

Pravin Patel, D. Aiken, A Boca et al. · IEEE Journal of Photovoltaics · 2012 · 71 citations

Radiation Hardening, Engineering, Energy Efficiency +17

High-efficiency quadruple junction solar cells using OMVPE with inverted metamorphic device structures

M.A. Stan, D. Aiken, B. Cho et al. · Journal of Crystal Growth · 2009 · 68 citations

Electrical Engineering, Engineering, Organic Solar Cell +6

Very high efficiency triple junction solar cells grown by MOVPE

M.A. Stan, D. Aiken, B. Cho et al. · Journal of Crystal Growth · 2008 · 64 citations

Materials Science, Electrical Engineering, Engineering +8

Real-time monitoring and control of epitaxial semiconductor growth in a production environment by in situ spectroscopic ellipsometry

Blaine Johs, Craig M. Herzinger, J. H. Dinan et al. · Thin Solid Films · 1998 · 41 citations

Real-time Monitoring, Electrical Engineering, Production Environment +9