Statistics
Publications
13
Citations
534
H-Index
11
Active since
2002
Narender Rana is an author at IBM (United States) specializing in engineering, metrology, and device characterization.
Publications per year
2002–2015
13
13
Classification of Brain Cancer using Artificial Neural Network
Dipali M. Joshi, Narender Rana, Vedant Misra · 2010 · 156 citations
A holistic metrology approach: hybrid metrology utilizing scatterometry, CD-AFM, and CD-SEM
Alok Vaid, Bin Bin Yan, Yun Tao Jiang et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2011 · 65 citations
Engineering, Electrical Engineering, Manufacturing Engineering +16
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