J. Baylet

Gain and Dark Current Characteristics of Planar HgCdTe Avalanche Photo Diodes

Gwladys Perrais, O. Gravrand, J. Baylet et al. · Journal of Electronic Materials · 2007 · 68 citations

Engineering, Electrical Engineering, Materials Science +14

XPS, Raman spectroscopy, X‐ray diffraction, specular X‐ray reflectivity, transmission electron microscopy and elastic recoil detection analysis of emissive carbon film characterization

A. Ermolieff, Amal Chabli, F. Pierre et al. · Surface and Interface Analysis · 2001 · 66 citations

Natural Sciences, Materials Engineering, Materials Science +13

Molecular beam epitaxy growth of HgCdTe on Ge for third-generation infrared detectors

J. P. Zanatta, Giacomo Badano, P. Ballet et al. · Journal of Electronic Materials · 2006 · 49 citations

Engineering, Materials Engineering, Materials Science +14

High performance characteristics in pin MW HgCdTe e-APDs

J. Rothman, Gwladys Perrais, G. Destéfanis et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2007 · 37 citations

Engineering, Electrical Engineering, Materials Science +16

Status of HgCdTe Bicolor and Dual-Band Infrared Focal Arrays at LETI

G. Destéfanis, J. Baylet, P. Ballet et al. · Journal of Electronic Materials · 2007 · 35 citations

Natural Sciences, Materials Engineering, Materials Science +14