S.A. Plimmer

Investigation of impact ionization in thin GaAs diodes

S.A. Plimmer, J.P.R. David, D C Herbert et al. · IEEE Transactions on Electron Devices · 1996 · 83 citations

Wide-bandgap Semiconductor, Electrical Engineering, Semiconductor Device +11

A simple model for avalanche multiplication including deadspace effects

S.A. Plimmer, J.P.R. David, Duu Sheng Ong et al. · IEEE Transactions on Electron Devices · 1999 · 78 citations

Mathematical Programming, Engineering, Deadspace Effects +20

Avalanche noise measurement in thin Si p+-i-n+ diodes

Chee Hing Tan, Jenny Clark, J.P.R. David et al. · Applied Physics Letters · 2000 · 63 citations

Electrical Engineering, Engineering, Physics +11

Low avalanche noise characteristics in thin InP p/sup +/-i-n/sup +/ diodes with electron initiated multiplication

K.F. Li, S.A. Plimmer, J.P.R. David et al. · IEEE Photonics Technology Letters · 1999 · 58 citations

Semiconductor Technology, Electrical Engineering, Engineering +11

Monte Carlo simulation of impact ionization and current multiplication in short GaAs diodes

G. M. Dunn, G.J. Rees, J.P.R. David et al. · Semiconductor Science and Technology · 1997 · 53 citations

Engineering, Current Multiplication, Semiconductor Device +17