Joachim C. Reiner

Statistics

Publications

Citations

105

H-Index

Active since

1994

Affiliations

École Polytechnique Fédérale de Lausanne(Current)

Swiss Federal Laboratories for Materials Science and Technology

Joachim C. Reiner is an author at École Polytechnique Fédérale de Lausanne specializing in engineering, gate oxide degradation, and semiconductor reliability.

Publications per year

1994–2007

Publications

Latent gate oxide defects caused by CDM-ESD

Joachim C. Reiner · 1995 · 29 citations

Engineering, Computer Engineering, Electrical Engineering +17

A CDM‐only reproducible field degradation and its reliability aspect

Horst Gieser, P. Egger, Joachim C. Reiner et al. · Quality and Reliability Engineering International · 1994 · 27 citations

Engineering, Electrical Engineering, Fault-tolerant Computing +15

Latent gate oxide damages caused by CDM-ESD

Joachim C. Reiner · Journal of Electrostatics · 1996 · 14 citations

Engineering, Electrical Engineering, Electronic Materials +11

Formation of electron traps in amorphous silica

Matteo Farnesi Camellone, Joachim C. Reiner, U. Sennhauser et al. · Physical Review B · 2007 · 14 citations · Full text

Natural Sciences, Materials Science, Physics +16

Novel FIB-based sample preparation technique for TEM analysis of ultra-thin gate oxide breakdown

Joachim C. Reiner, Philippe Gasser, U. Sennhauser · Microelectronics Reliability · 2002 · 11 citations

Engineering, Electrical Engineering, Materials Science +14

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