Concepedia

Hsing-Chung Liang

HL

7

Publications

171

Citations

7

H-Index

1995

Active since

Affiliations

National Yang Ming Chiao Tung University(Current)

Industrial Technology Research Institute

National Sun Yat-sen University

Chung Yuan Christian University

Chung Hua University

Hsing-Chung Liang is an author at National Yang Ming Chiao Tung University specializing in engineering, computer engineering, and software testing.

Top concepts

EngineeringComputer ScienceSoftware TestingComputer EngineeringDesign For TestingReliability EngineeringDiagnosisVerificationFormal MethodsProgram Analysis

Publications per year

1995–2022

7

Publications

7

Machine Learning-Based Detection Method for Wafer Test Induced Defects

Ken Chau-Cheung Cheng, Leon Li-Yang Chen, Jiwei Li et al. · IEEE Transactions on Semiconductor Manufacturing · 2021 · 55 citations

Engineering, Machine Learning, Machine Learning Algorithms +17

Identifying untestable faults in sequential circuits

Hsing-Chung Liang, Chung Len Lee, J.E. Chen · IEEE Design & Test of Computers · 1995 · 40 citations

Engineering, Sandia National Laboratories, Project Management +26

Wafer Defect Pattern Labeling and Recognition Using Semi-Supervised Learning

Katherine Shu-Min Li, Xuhao Jiang, Leon Li-Yang Chen et al. · IEEE Transactions on Semiconductor Manufacturing · 2022 · 24 citations

Root Cause Analysis, Engineering, Machine Learning +19

Invalid state identification for sequential circuit test generation

Hsing-Chung Liang, Chung Len Lee, J.E. Chen · 2002 · 15 citations

Engineering, Verification, Test Data Generation +17

Hidden Wafer Scratch Defects Projection for Diagnosis and Quality Enhancement

Katherine Shu-Min Li, Peter Yi-Yu Liao, Ken Chau-Cheung Cheng et al. · IEEE Transactions on Semiconductor Manufacturing · 2020 · 14 citations

Engineering, Wafer Maps, Surface Integrity +16

Rows per page

1–5 of 7