Takahisa Hiraide is an author at Fujitsu (Japan) specializing in computer engineering, electrical engineering, and design for testing.
Top concepts
EngineeringSoftware TestingBuilt-in Self-testDesign For TestingComputer EngineeringElectrical EngineeringEducationRadiologyCalibrationVlsi Design
Publications per year
2003–2006
2
2
BIST-aided scan test - a new method for test cost reduction
Takahisa Hiraide, Kwame Osei Boateng, Hideaki Konishi et al. · 2003 · 63 citations
Electrical Engineering, Engineering, Test Cost Reduction +15
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