Statistics
Publications
1
Citations
63
H-Index
1
Active since
2003
Affiliations
Fujitsu (Japan)(Current)
Hideaki Konishi is an author at Fujitsu (Japan) specializing in computer engineering, radiology, and calibration.
Publications per year
2003–2003
1
1
BIST-aided scan test - a new method for test cost reduction
Takahisa Hiraide, Kwame Osei Boateng, Hideaki Konishi et al. · 2003 · 63 citations
Electrical Engineering, Engineering, Test Cost Reduction +15
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