Kangwook Park

Impact of TSV proximity on 45nm CMOS devices in wafer level

Sungdong Cho, Sinwoo Kang, Kangwook Park et al. · 2011 · 17 citations

Engineering, Electrical Engineering, Electronic Materials +15

RF Model of BEOL Vertical Natural Capacitor (VNCAP) Fabricated by 45-nm RF CMOS Technology and Its Verification

In Man Kang, Seungjae Jung, Tae‐Hoon Choi et al. · IEEE Electron Device Letters · 2009 · 16 citations

Engineering, Electrical Engineering, Circuit Theory +16

High-Voltage Drain-Extended FinFET With a High-${k}$ Dielectric Field Plate

Hyangwoo Kim, Hyeonsu Cho, Byoung Don Kong et al. · IEEE Transactions on Electron Devices · 2020 · 13 citations

Engineering, Computer Engineering, Electrical Engineering +10

Characterization and Modeling of RF-Performance $(f_{T})$ Fluctuation in MOSFETs

Hansu Kim, Chulho Chung, Jinsung Lim et al. · IEEE Electron Device Letters · 2009 · 11 citations

Engineering, Electrical Engineering, Electronic Materials +16