Concepedia

Investigation of grain boundaries in BaSi2 epitaxial films on Si(1 1 1) substrates using transmission electron microscopy and electron-beam-induced current technique

Masakazu Baba, Katsuaki Toh, Kaoru Toko, Noriyuki Saito, Noriko Yoshizawa, Karolin Jiptner, Takashi Sekiguchi, Kosuke O. Hara, Noritaka Usami, Takashi Suemasu

Journal of Crystal Growth · 2012 · 147 citations · 19 references

DOI

Concepts

References

19

Limiting efficiencies of ideal single and multiple energy gap terrestrial solar cells

C. H. Henry · Journal of Applied Physics · 1980 · 1K citations

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Charge collection scanning electron microscopy

H. J. Leamy · Journal of Applied Physics · 1982 · 776 citations

, , +17

Electron-beam-induced current study of grain boundaries in multicrystalline silicon

Jun Chen, Takashi Sekiguchi, Deren Yang et al. · Journal of Applied Physics · 2004 · 232 citations

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Optical and electrical properties of semiconducting BaSi2 thin films on Si substrates grown by molecular beam epitaxy

K. Morita, Yuya Inomata, Takashi Suemasu · Thin Solid Films · 2005 · 202 citations

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Isostructural BaSi<sub>2</sub>, BaGe<sub>2</sub> and SrGe<sub>2</sub>: electronic and optical properties

physica status solidi (b) · 2007 · 172 citations · Full text

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