Flexible magnetoelectric sensor and nonvolatile memory based on magnetization-graded Ni/FSMA/PMN-PT multiferroic heterostructure

Abstract

Flexible multiferroic heterostructures are promising to unveil technological developments in wearable magnetic field sensing, nonvolatile memory, soft robotics, and portable energy harvesters. Here, we report an enhanced and a zero-biased magnetoelectric (ME) effect in flexible, cost-effective, and room temperature sensitive Ni/FSMA/PMN-PT magnetization-graded ME heterostructure. Flexible Ni foil with −q (piezomagnetic coefficient) and the ferromagnetic shape memory alloy (FSMA; Ni-Mn-In) layer with +q offers the desired q-grading. The temperature-dependent dielectric behavior shows an anomaly in the martensite transformation regime of the FSMA layer. The Ni/FSMA/PMN-PT ME heterostructure exhibits noteworthy ME output of ∼3.7 V/cm Oe, significantly higher than Ni/PMN-PT (∼1 V/cm Oe). The q-grading-induced bending moment impedes the asymmetry-related flexural strain and strengthens the ME interaction. The zero-bias ME output of ∼0.4 V/cm Oe is ascribed to the interaction between q-grading-induced transverse magnetization and AC magnetic field. Ni/Ni-Mn-In/PMN-PT ME heterostructure displays excellent magnetic field sensing parameters: correlation coefficient, sensitivity, inaccuracy, and hysteresis of 0.99916, ∼0.74 mV/Oe, 1.5% full-scale output (FSO), and 1.8% FSO, respectively. The reversible and repeatable nonvolatile switching of the ME coefficient obtained with positive and negative electric fields is useful for next-generation memory devices. The flexible ME heterostructure shows no degradation in performance up to 1500 bending cycles. Such Ni/FSMA/PMN-PT based ME heterostructures are propitious for multifunctional flexible magnetic field sensors and nonvolatile memory applications.