IEEE Transactions on Semiconductor Manufacturing · 2013 · 49 citations · 0 references
EngineeringElectrical EngineeringPhysicsElectronic MaterialsMicroelectronicsSemiconductor DevicesDevice CharacterizationNanoelectronicsSemiconductor Device MaterialsWide Band Gap SemiconductorsWide-bandgap Semiconductor DevicesWide-bandgap SemiconductorsAvalanche Breakdown In Wide-bandgap DevicesNanoelectronic Device PhysicsNanoelectronic Devices