IEEE Electron Device Letters · 2017 · 115 citations · 0 references
EngineeringElectrical EngineeringPhysicsElectronic MaterialsMicroelectronicsSemiconductor DevicesDevice CharacterizationDevice ModelingNanoelectronicsSemiconductor Device MaterialsWide-bandgap Semiconductor DevicesWide-bandgap SemiconductorsAvalanche Breakdown In Wide-bandgap DevicesNanoelectronic Device PhysicsNanoelectronic Devices