Proceedings of IEEE International Conference on Computer Aided Design (ICCAD) · 2002 · 37 citations · 6 references
EngineeringComputer EngineeringElectrical EngineeringAnalog ElectronicsOptimizationTest ConstructionAnalog Integrated CircuitsDesign For TestabilityDynamic OptimizationMixed-signal Integrated Circuit DesignAnalog Built-in Self-testAnalog TestabilityArbitrary Waveform GenerationBuilt-in Self-test For Analog CircuitsCmos Analog Integrated CircuitsTest DesignWaveform Design
In this paper we present an approach to construct dynamic test signals for analog circuits. Using the integral measure for characterizing time-domain signals, we extend the minmax formulation of the static test problem to the dynamic case. A sub-optimal solution strategy, similar to dynamic programming methods is used to construct the test waveforms. The approach presented here may be used to construct input signals for an on-chip test scheme or for the selection of an external stimulus applied through an arbitrary waveform generator.
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Designs for Computer Experiments
Jerome Sacks, Susannah B. Schiller, William J. Welch · Technometrics · 1989 · 912 citations
Test Vector Generation for Linear Analog Devices
S.-J. Tsai · 2005 · 78 citations