2014 · 97 citations · 5 references
EngineeringComputer EngineeringElectrical EngineeringMicroelectronicsSemiconductor DevicesStorage SystemsDevice ScalingMemory DevicesMemory Subsystem DesignExtreme Ultraviolet LithographyFlash MemoryFlash Memory DevicesManufacturingNand Flash MemoryNon-volatile Memory DesignThree-dimensional MemoryThroughput
Recent advances in 3D NAND Flash have demonstrated feasibility and chip implementation, yet scaling challenges and rising manufacturing costs from quadruple patterning and EUV lithography drive the need for next‑generation nodes beyond 16 nm. This work introduces a cost‑effective, highly scalable 3D 128 Gb 2‑bit‑per‑cell vertical‑NAND flash memory. The device is realized as a true 3D 128 Gb 2‑bit‑per‑cell vertical‑NAND architecture, enabling lower manufacturing cost and improved scalability. The chip delivers 50 MB/s write throughput at 3 K endurance for embedded use, and 33 MB/s write throughput at 35 K endurance for data‑center and enterprise SSDs.
In the past few years, various 3D NAND Flash memories have been demonstrated, from device feasibility to chip implementation, to overcome scaling challenges in conventional planar NAND Flash [1-3]. The difficulties include shrinking the NAND cell and increasing manufacturing costs due to quadruple patterning and extreme ultraviolet lithography, motivating the development of the next-generation node beyond 16nm-class NAND Flash [4]. In this paper, as a new 3D memory device with lower manufacturing cost and superior device scalability, we present a true 3D 128Gb 2b/cell vertical-NAND (V-NAND) Flash. The chip accomplishes 50MB/s write throughput with 3K endurance for typical embedded applications such as mobile and personal computer. Also, extended endurance of 35K is achieved with 33MB/s of write throughput for data center and enterprise SSD applications.
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A 64Gb 533Mb/s DDR interface MLC NAND Flash in sub-20nm technology
Daeyeal Lee, Ik‐Joon Chang, Sang-Yong Yoon et al. · 2012 · 49 citations
Engineering, Computer Engineering, Electrical Engineering +15
A 7MB/s 64Gb 3-bit/cell DDR NAND flash memory in 20nm-node technology
Kitae Park, Oh-Suk Kwon, Sang-Yong Yoon et al. · 2011 · 32 citations
Engineering, Computer Engineering, Electrical Engineering +16
Multi-stacked 1G cell/layer Pipe-shaped BiCS Flash Memory
Takashi Maeda, Kiyotaro Itagaki, Tomoo Hishida et al. · 2009 · 22 citations
Engineering, Computer Engineering, Electrical Engineering +17