Deep-level trap formation in Si-substituted Sr2SnO4:Sm3+ for rewritable optical information storage

Jiaren Du, Shaoxing Lyu, Kai Jiang, Dayu Huang, Jinhua Li, Rik Van Deun, Dirk Poelman, Hengwei Lin

Materials Today Chemistry · 2022 · 26 citations · 42 references

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