Imaging Current Paths in Silicon Photovoltaic Devices with a Quantum Diamond Microscope

Abstract

Quantum diamond microscopy is emerging as a tool for magnetic current imaging (MCI) of electrical devices. Due to the optical invasiveness of the technique, it has not been extended to photovoltaic (PV) devices---until now. This study employs a stroboscopic measurement protocol that allows temporally resolved measurements of silicon PV cells, independent of stimulus. The authors capitalize on the contactless aspect of MCI to image photocurrent loops that are entirely internal to the device (e.g. under open-circuit conditions), equivalent to shunt-resistance paths. The versatile capabilities of quantum diamond microscopy may find wide application in this further context.