An Updated Analysis to the WCT-120 QSSPC Measurement System Using Advanced Device Physics

Abstract

The characterization analysis used in the excess-carrier recombination lifetime and the total emitter saturation current density, J0, measurement of the Sinton Instruments’ WCT-120 has been updated to enable the use of new analysis methods. The option to analyze Auger-corrected lifetime data using the Richter Auger model in lieu of the Sinton/Swanson Auger model is now available. Additionally, the option to implement a band-gap narrowing analysis in the calculation of the intrinsic carrier concentration, ni, that is used to measure J0 is also available. This paper compares the new analysis options to the previously implemented analyses. Overall, there is a small difference between the Auger analyses with at most a 4% shift of the corrected lifetime at a carrier density of 2×1015 cm-3. This small shift due to the Richter Auger analysis translates to a negligible shift in the measured J0 with the new model. The change in J0 due to the band-gap narrowing analysis is proportional to the measured J0 value with a 17% shift for a 1 Ω-cm p-type sample at 2×1015 cm-3.