RL-Sizer: VLSI Gate Sizing for Timing Optimization using Deep Reinforcement Learning

Yi‐Chen Lu, Siddhartha Nath, Vishal Khandelwal, Sung Kyu Lim

2021 · 63 citations · 17 references

Concepts

TL;DR

Gate sizing is a critical EDA step, yet expanding design sizes and tight schedules constrain traditional algorithms, while high‑performance low‑power designs require more powerful optimization methods. This study formulates gate sizing as a reinforcement learning problem and introduces RL‑Sizer, an autonomous agent that performs timing optimization without supervision. RL‑Sizer models the sizing task as an RL process, learning to adjust gate widths to minimize timing violations through an unsupervised policy trained on design data. Experiments on six commercial designs in 5–16 nm nodes show that RL‑Sizer improves the native Synopsys ICC2 sizing, achieving better total negative slack and fewer violating endpoints on four designs with negligible power impact and comparable results on the others.

Abstract

Gate sizing for timing optimization is performed extensively throughout electronic design automation (EDA) flows. However, increasing design sizes and time-to-market pressure force EDA tools to maintain pseudo-linear complexity, thereby limiting the global exploration done by the underlying sizing algorithms. Furthermore, high-performance low-power designs are pushing the envelope on power, performance and area (PPA), creating a need for last mile PPA closure using more powerful algorithms. Reinforcement learning (RL) is a disruptive paradigm that achieves high-quality optimization results beyond traditional algorithms. In this paper, we formulate gate sizing as an RL process, and propose RL-Sizer, an autonomous gate sizing agent, which performs timing optimization in an unsupervised manner. In the experiments, we demonstrate that RL-Sizer can improve the native sizing algorithms of an industry-leading EDA tool, Synopsys IC-Compiler II (ICC2), on 6 commercial designs in advanced process nodes (5 – 16nm). RL-Sizer delivers significantly better total negative slack (TNS) and number of violating endpoints (NVEs) on 4 designs with negligible power overhead, while achieving parity on athe others.

References

17